John True Jr.: X-ray Computed Tomography is where engineering and materials science collide
John True Jr. earned his PhD in Electrical and Computer Engineering at the University of Florida, where he focused on the development of X-ray computed tomogrpahy algorithms for extracting design information from electronics. Today, he brings that expertise to the NOCTURN program, spearheading the automation of crucial data processes at the Florida Museum. By integrating cutting-edge software tools and rigorous data models, John is working to ensure that researchers and curators can seamlessly access and manage vast collections of artifacts and specimens.
John received his BS degree in materials science and engineering from the University of Florida in 2020. He holds a certificate for semiconductor materials and has experience as a process engineer at Axcelis Technologies and as a Unmanned Aerial systems engineer with AURA Network Systems. His PhD research was focused on X-ray micro-CT reconstruction methods for semiconductor materials and developing quality assurance methods for semiconductor devices.
Outside academia, John is an avid biker, exploring Florida’s lush springs and state parks every chance he gets. He also dabbles in woodworking, crafting functional creations from natural woods.
Below is a collection of research papers in Markdown format based on the provided references:
-
Review of THz-based semiconductor assurance
True, J., Xi, C., Jessurun, N., Ahi, K., & Asadizanjani, N.
Optical Engineering, 60(6), 060901-060901, 2021 -
Machine learning assisted counterfeit IC detection through non-destructive infrared (IR) spectroscopy material characterization
Xi, C., Jessurun, N., True, J., Khan, A.A., Tehranipoor, M.M., & Asadizanjani, N.
IEEE 72nd Electronic Components and Technology Conference (ECTC), 2249-2255, 2022 -
FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection
Mehta, D., True, J., Dizon-Paradis, O.P., Jessurun, N., Woodard, D.L., et al.
Cryptology ePrint Archive, 2022 -
Terahertz based machine learning approach to integrated circuit assurance
True, J., Xi, C., Jessurun, N., Ahi, K., Tehranipoor, M., & Asadizanjani, N.
IEEE 71st Electronic Components and Technology Conference (ECTC), 2235-2245, 2021 -
QUAINTPEAX: QUantifying algorithmically INTrinsic properties of electronic assemblies via X-ray CT
True, J., Jessurun, N., Mehta, D., & Asadi, N.
Microscopy and Microanalysis, 27(S1), 1222-1225, 2021